Nombre de documents trouvés : 85 documents

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Power-Aware Test Pattern Generation for At-Speed LOS Testing Bosio A., Dilillo L., Girard P., Todri A., Virazel A., Miyase K., Wen X. ATS'11: IEEE Asian Test Symposium, Special Session on "Power-Aware Testing", Inde [lirmm-00651917 - version 1]

Failure Analysis and Test Solutions for Low-Power SRAMs Zordan L., Bosio A., Dilillo L., Girard P., Todri A., Virazel A., Badereddine N. ATS'11: IEEE Asian Test Symposium, Special Session on "Memory BIST Advances for Nanoscale Technologies", Inde [lirmm-00651911 - version 1]

Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling Miyase K., Uchinodan Y., Enokimoto K., Yamato Y., Wen X., Kajihara S., Wu F., Dilillo L., Bosio A., Girard P. et al ATS'11: Asian Test Symposium, Inde [lirmm-00651247 - version 1]

A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits Parity Prediction Synthesis for Nano-Electronic Gate Designs Tran A. D., Virazel A., Bosio A., Dilillo L., Girard P., Pravossoudovitch S., Wunderlich H.-J. ATS'11: IEEE Asian Test Symposium, Inde [lirmm-00651238 - version 1]

Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector Dilillo L., Bosio A., Valka M., Girard P., Pravossoudovitch S., Virazel A. DFT'11: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Canada [lirmm-00651226 - version 1]

On Using Address Scrambling to Implement Defect Tolerance in SRAMs Alves Fonseca R., Dilillo L., Bosio A., Girard P., Pravossoudovitch S., Virazel A., Badereddine N. ITC'11: IEEE International Test Conference, États-Unis [lirmm-00647773 - version 1]

Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing Todri A., Bosio A., Dilillo L., Girard P., Pravossoudovitch S., Virazel A. NEWCAS'11: IEEE International NEWCAS Conference, France [lirmm-00647815 - version 1]

Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme Wu F., Dilillo L., Bosio A., Girard P., Pravossoudovitch S., Virazel A., Tehranipoor M., Miyase K., Wen X., Ahmed N. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Norvège [lirmm-00651905 - version 1]

Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems Todri A., Bosio A., Dilillo L., Girard P., Pravossoudovitch S., Virazel A. LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Norvège [lirmm-00651802 - version 1]

Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test Bench Dilillo L., Bosio A., Girard P., Pravossoudovitch S., Virazel A. Workshop on Dependability Issues in Deep-Submicron Technologies, Norvège [lirmm-00651796 - version 1]

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