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IEEE Transactions on Instrumentation and Measurement 60 (2011) 768-775
Fast Digital Post-Processing Technique for INL Correction of ADC: Validation on a 12-bit Folding-and-Interpolating Analog-to-Digital Converter
Vincent Kerzérho 1, Vincent Fresnaud 2, Dominique Dallet 3, Serge Bernard 1, Lilian Bossuet 3
(2011)

The semiconductor industry tends to constantly increase the performances of developed systems with an ever-shorter time-to-market. In this context, the conventional strategy for mixed-signal component design, which is based only on analog design effort, will no longer be suitable. In this paper, a digital correction technique is presented for Analog-to-Digital Converters (ADC). The idea is to use a Look-Up-Table (LUT) for the online correction of Integral Non-Linearity (INL). The main challenge for this kind of technique is the cost in time and resources to estimate the actual INL of the ADC needed to load the LUT. In this paper we propose to extract INL with a very rapid procedure based on spectral analysis. We validate our technique on a 12-bit Folding-and-Interpolating ADC and we demonstrate that the correction is efficient for a large range of application fields.
1 :  Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM)
CNRS : UMR5506 – Université Montpellier II - Sciences et Techniques du Languedoc
2 :  NXP Semiconductors
NXP semiconductors
3 :  Laboratoire de l'intégration, du matériau au système (IMS)
CNRS : UMR5218 – Université Sciences et Technologies - Bordeaux I – Institut Polytechnique de Bordeaux
[SysMic]
Sciences de l'ingénieur/Micro et nanotechnologies/Microélectronique
Analog-to-Digital Converter (ADC) – Integral Non Linearity (INL) – non-linearity correction – Look-Up-Table (LUT)

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