Security Memory test SRAM Power demand Thermal sensor Automatic test pattern generation Electromagnetic Analysis 3D Sensors SER Failure analysis Integrated circuit interconnections Microprocessors Hardware Soft errors Analytical models CMOS Diagnostic Delay testing Neutron Embedded systems Simulation Calibration Crosstalk Robustness CMOS integrated circuits ATPG Integrated circuit design Fault tolerance Magnetic tunneling Resistive-open defects Transistors Integrated circuit modeling Cryptography Fault injection Libraries Hardware security Radiation Cross-section DFT Spintronics Delays AES SoC Transient faults Fault attacks Fault modeling Modeling SEU Sensor FPGA RSA Accelerometer Memories Memory Variability Core-cell Logic gates Logic testing Test Low power Countermeasures Low-power design Hardware Trojan Integrated circuit testing Switches Monitoring Temperature distribution Heating Accelerometers MEMS Multiple cell upset MCU Flip-flops BIST Soft Error Rate Memory device Noise Design space exploration DPA Cross section Neutrons Field programmable gate arrays Silicon Fiabilité Heavy ions Clocks Design Testing Cryptographie Testability Atmospheric neutrons Single Event Upset Random access memory Circuit faults VLSI Through-silicon vias MRAM Computer architecture Reliability Single event upset SEU