RSA Cryptographie BIST Fiabilité Testing Circuit testing Variability Security Transient faults Single Event Upset Transistors SRAM Testability Heating Cryptography Integrated circuit testing MRAM Integrated circuit modeling Microprocessors Low power Atmospheric neutrons Single event upset SEU Electromagnetic Analysis Integrated circuit interconnections Memories Estimation Integrated circuit design Field programmable gate arrays Voltage ATPG Design space exploration AES MEMS Hardware CMOS Heavy ions Memory test Crosstalk Calibration Thermal sensor Fault injection Radiation DFT SEU Diagnostic Memory device Logic gates DPA Soft errors Neutrons Power demand Libraries FPGA Reliability Cross-section SoC Multiple cell upset MCU VLSI Monitoring Automatic test pattern generation Neutron Noise Low-power design Hardware Trojan Clocks Magnetic tunneling Fault attacks Simulation Design Memory Power consumption Silicon Through-silicon vias Analytical models Switches SER Cross section Failure analysis Accelerometer Sensors Spintronics Countermeasures Fault tolerance Random access memory Computer architecture Resistive-open defects Flip-flops Embedded systems Delay testing Fault modeling Test Modeling Delays Circuit faults Hardware security Core-cell Robustness Accelerometers CMOS integrated circuits Logic testing