Crosstalk Single Event Upset Single event upset SEU Neutrons Estimation Core-cell Heavy ions Flip-flops Simulation Cross-section Integrated circuit design Calibration RSA Spintronics CMOS Circuit faults Low-power design Magnetic tunneling Multiple cell upset MCU Integrated circuit testing VLSI Logic testing Heating Soft errors Fault injection Sensors Logic gates Fault attacks Power consumption Clocks Accelerometers Memory test Design space exploration Delay testing Fiabilité Circuit testing Cryptographie Fault tolerance Power demand Through-silicon vias Neutron Testing Cryptography Memory device Fault modeling Automatic test pattern generation Analytical models Test Low power Microprocessors Countermeasures Accelerometer Electromagnetic Analysis Failure analysis Cross section Resistive-open defects Delays BIST SoC SER DFT Security Libraries AES Computer architecture Modeling DPA Design Integrated circuit interconnections Silicon Memory Radiation Robustness Random access memory Voltage Switches MEMS Integrated circuit modeling ATPG Memories FPGA Hardware security Monitoring Variability Reliability SEU Hardware Transient faults SRAM Field programmable gate arrays Thermal sensor CMOS integrated circuits Embedded systems Diagnostic Testability Atmospheric neutrons MRAM Transistors Hardware Trojan Noise