DFT Cross section Hardware Atmospheric neutrons Hardware Trojan Multiple cell upset MCU Fault tolerance Fiabilité Calibration Modeling Power consumption Soft errors SEU Design Delay testing SER MRAM VLSI Estimation Diagnostic Core-cell Monitoring Low-power design Field programmable gate arrays Memory test Security Countermeasures Microprocessors CMOS integrated circuits Cryptographie Design space exploration Single event upset SEU Accelerometers Silicon ATPG SoC Memory device Accelerometer AES Thermal sensor Power demand Circuit faults Resistive-open defects Heavy ions Cryptography Radiation MEMS Neutrons Magnetic tunneling Hardware security Computer architecture Fault injection Testing Integrated circuit interconnections RSA Memory Crosstalk Reliability Random access memory Integrated circuit testing CMOS Testability Neutron Transient faults Variability Voltage Analytical models Spintronics Delays Logic testing Flip-flops Noise Circuit testing Clocks Electromagnetic Analysis SRAM FPGA DPA Integrated circuit design Integrated circuit modeling Transistors Test Memories Automatic test pattern generation Low power Failure analysis Logic gates Simulation Switches Cross-section Embedded systems Fault attacks Heating BIST Libraries Single Event Upset Through-silicon vias Robustness Fault modeling Sensors