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Number of Files
524
Nomber of Notices
1 163
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Tags
Crosstalk
Single Event Upset
Single event upset SEU
Neutrons
Estimation
Core-cell
Heavy ions
Flip-flops
Simulation
Cross-section
Integrated circuit design
Calibration
RSA
Spintronics
CMOS
Circuit faults
Low-power design
Magnetic tunneling
Multiple cell upset MCU
Integrated circuit testing
VLSI
Logic testing
Heating
Soft errors
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Logic gates
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Design space exploration
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Fault modeling
Automatic test pattern generation
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Electromagnetic Analysis
Failure analysis
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BIST
SoC
SER
DFT
Security
Libraries
AES
Computer architecture
Modeling
DPA
Design
Integrated circuit interconnections
Silicon
Memory
Radiation
Robustness
Random access memory
Voltage
Switches
MEMS
Integrated circuit modeling
ATPG
Memories
FPGA
Hardware security
Monitoring
Variability
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SEU
Hardware
Transient faults
SRAM
Field programmable gate arrays
Thermal sensor
CMOS integrated circuits
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Diagnostic
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Atmospheric neutrons
MRAM
Transistors
Hardware Trojan
Noise