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Number of Files
519
Nomber of Notices
1 170
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Tags
Security
Memory test
SRAM
Power demand
Thermal sensor
Automatic test pattern generation
Electromagnetic Analysis
3D
Sensors
SER
Failure analysis
Integrated circuit interconnections
Microprocessors
Hardware
Soft errors
Analytical models
CMOS
Diagnostic
Delay testing
Neutron
Embedded systems
Simulation
Calibration
Crosstalk
Robustness
CMOS integrated circuits
ATPG
Integrated circuit design
Fault tolerance
Magnetic tunneling
Resistive-open defects
Transistors
Integrated circuit modeling
Cryptography
Fault injection
Libraries
Hardware security
Radiation
Cross-section
DFT
Spintronics
Delays
AES
SoC
Transient faults
Fault attacks
Fault modeling
Modeling
SEU
Sensor
FPGA
RSA
Accelerometer
Memories
Memory
Variability
Core-cell
Logic gates
Logic testing
Test
Low power
Countermeasures
Low-power design
Hardware Trojan
Integrated circuit testing
Switches
Monitoring
Temperature distribution
Heating
Accelerometers
MEMS
Multiple cell upset MCU
Flip-flops
BIST
Soft Error Rate
Memory device
Noise
Design space exploration
DPA
Cross section
Neutrons
Field programmable gate arrays
Silicon
Fiabilité
Heavy ions
Clocks
Design
Testing
Cryptographie
Testability
Atmospheric neutrons
Single Event Upset
Random access memory
Circuit faults
VLSI
Through-silicon vias
MRAM
Computer architecture
Reliability
Single event upset SEU