Transient faults Analytical models Security Noise Clocks Memory Single event upset SEU Robustness Logic testing Memory device ATPG Fault attacks Automatic test pattern generation Atmospheric neutrons Hardware DPA Soft errors Core-cell Sensors RSA Voltage Accelerometers Thermal sensor Heating Electromagnetic Analysis CMOS Testability Design space exploration Test Low-power design Single Event Upset Monitoring Silicon Heavy ions Through-silicon vias Logic gates DFT MRAM Simulation Power consumption Cross-section Design Switches Flip-flops SRAM Failure analysis Circuit testing Power demand Multiple cell upset MCU Radiation Cryptographie Integrated circuit testing Fault tolerance Integrated circuit interconnections SoC Neutron Circuit faults Accelerometer Hardware security Modeling Memories Reliability SEU Hardware Trojan Integrated circuit modeling Spintronics CMOS integrated circuits Testing Libraries Neutrons Cryptography Resistive-open defects Magnetic tunneling Crosstalk Delay testing FPGA Fault injection Cross section Variability Random access memory Field programmable gate arrays Computer architecture Fiabilité Delays Low power Calibration BIST Estimation Countermeasures SER Fault modeling Diagnostic Embedded systems Integrated circuit design VLSI MEMS AES Microprocessors Memory test Transistors