- Filtres
- Test and dEpendability of microelectronic integrated SysTems (1100642)
- Test and dEpendability of microelectronic integrated SysTems (487992)
- Almeida dos Santos Douglas
- Ammoura Lila
- Asciolla Dario
- Asokan Anu
- Ayari Haithem
- Azaïs Florence
- Azevedo João
- Barbareschi Mario
- Barik Sanaa
- Bezerra Eduardo Augusto
- Bosio Alberto
- Bosser Alexandre
- Brugger Markus
- Chehaitly Mouhamad
- Cocquerez Philippe
- Comte Mariane
- da Silva Mathieu
- David-Grignot Stéphane
- de Castro Stephan
- Deluthault Anthony
- Deveautour Bastien
- d’Hondt Pierre
- Dilillo Luigi
- Di Natale Giorgio
- Dupuis Sophie
- El Badawi Hassan
- Farjallah Emna
- Ferraro Rudy
- Flottes Marie-Lise
- Frost Christopher
- Galliere Jean-Marc J.-M.
- Gil Thierry
- Girard Patrick
- Gupta Viyas
- Harcha Ghita
- Ho Tien-Phu
- Imianosky Carolina
- Javanainen Arto
- Karel Amit
- Kooli Maha
- Lapeyre Sébastien
- Larguech Syhem
- Latorre Laurent
- Lu Feng
- Martins Pio de Mattos André
- Matana Luza Lucas
- Mekki Julien
- Mhamdi Safa
- Momo Metzler Carolina
- Nguyen Quang-Linh
- Nocua Alejandro
- Patel Darayus Adil
- Pradarelli Béatrice
- Pravossoudovitch Serge
- Renovell Michel
- Riadi Nassim
- Rossi de Melo Douglas
- Rouzeyre Bruno
- Saigné Frédéric
- Singh Keshav
- Sun Zhenzhou
- Touati Aymen
- Traiola Marcello
- Tsiligiannis Georgios
- Valea Emanuele
- Valka Miroslav
- Vayssade Thibault
- Vaz Pablo Ilha
- Virazel Arnaud
- Wali Imran
- Wrobel Frédéric
- Xhafa Xhesila