browse-meta - Test and dEpendability of microelectronic integrated SysTems

ACM Journal on Emerging Technologies in Computing Systems 3

Acta Astronautica 1

Computer 1

Electronics 5

Fishes 1

IEEE Access 2

IEEE Design & Test 6

IEEE Transactions on Aerospace and Electronic Systems 4

IEEE Transactions on Circuits and Systems I: Regular Papers 3

IEEE Transactions on Circuits and Systems II: Express Briefs 1

IEEE Transactions on Circuits and Systems Part 1 Fundamental Theory and Applications 1

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 4

IEEE Transactions on Computers 2

IEEE Transactions on Device and Materials Reliability 4

IEEE Transactions on Education 1

IEEE Transactions on Emerging Topics in Computing 4

IEEE Transactions on Nanotechnology 2

IEEE Transactions on Nuclear Science 15

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 6

Journal of Circuits, Systems, and Computers 4

Journal of Cryptographic Engineering 1

Journal of Electronic Testing: : Theory and Applications 15

Journal of Instrumentation 2

Journal of Low Power Electronics 1

Journal sur l'enseignement des sciences et technologies de l'information et des systèmes 1

Microelectronics Journal 5

Microelectronics Reliability 15

Micromachines 1

Microprocessors and Microsystems: Embedded Hardware Design 3

Proceedings of the IEEE 2

Semiconductor Science and Technology 1

Sensors 1