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 Testing System-In-Package Wirelessly Serge Bernard f8d34c7abdde2330536e5723660971d2 lirmm.fr serge-bernard 1186 2032-1186 http://www.researcherid.com/rid/N-4452-2016 https://orcid.org/0000-0003-1772-0592 https://www.idref.fr/121569209 http://www.researcherid.com/rid/http://www.researcherid.com/rid/N-4452-2016 David Andreu 28655503319fe0a5e28d03576b89a20b lirmm.fr david-andreu 8402 29875-8402 https://orcid.org/0000-0002-0744-9447 https://orcid.org/0000-0002-6317-6666 https://www.idref.fr/121828840 Marie-Lise Flottes 66731dffe906565f591b33d6028b314e lirmm.fr marie-lise-flottes 3580 15496-3580 https://www.idref.fr/142992321 https://orcid.org/0000-0002-7231-3976 Philippe Cauvet 164959-0 Hervé Fleury 131534-0 Fabrice Verjus 164960-0 Martine Peridier c2991973e5c01c2376ee6dbe9de59840 lirmm.fr.invalid 2006-09-15 10:29:02 2025-08-13 03:10:28 2006-09-15 14:59:22 2006-09-05 2006-09-15 contributor Martine Peridier c2991973e5c01c2376ee6dbe9de59840 lirmm.fr.invalid CCSD lirmm-00094916 https://hal-lirmm.ccsd.cnrs.fr/lirmm-00094916 bernard:lirmm-00094916 <i>DTIS: Design and Technology of Integrated Systems in Nanoscale Era</i>, Sep 2006, Tunis, Tunisia. pp.222-226 DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Sep 2006, Tunis, Tunisia. pp.222-226 HAL Authorization CNRS - Centre national de la recherche scientifique SysMic Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier MIC Département Microélectronique Mathématiques, Informatique, Physique et Systèmes Université de Montpellier Université de Montpellier (2015-2021) International No No Yes Yes Testing System-In-Package Wirelessly Serge Bernard f8d34c7abdde2330536e5723660971d2 lirmm.fr serge-bernard 1186 2032-1186 http://www.researcherid.com/rid/N-4452-2016 https://orcid.org/0000-0003-1772-0592 https://www.idref.fr/121569209 http://www.researcherid.com/rid/http://www.researcherid.com/rid/N-4452-2016 David Andreu 28655503319fe0a5e28d03576b89a20b lirmm.fr david-andreu 8402 29875-8402 https://orcid.org/0000-0002-0744-9447 https://orcid.org/0000-0002-6317-6666 https://www.idref.fr/121828840 Marie-Lise Flottes 66731dffe906565f591b33d6028b314e lirmm.fr marie-lise-flottes 3580 15496-3580 https://www.idref.fr/142992321 https://orcid.org/0000-0002-7231-3976 Philippe Cauvet 164959-0 Hervé Fleury 131534-0 Fabrice Verjus 164960-0 Design and Technology of Integrated Systems in Nanoscale Era DTIS: Design and Technology of Integrated Systems in Nanoscale Era 2006-09-05 2006-09-07 Tunis Tunisia IEEE 222-226 2006 English wireless testing scan test system test SiP Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Conference papers Conference papers Conference papers

The paper shows a new concept for testing a systemin- package (SiP) using a wireless communication. Trends of the SiP technology put more economic and technical constraints onto the test, while the contactless test techniques represent an opportunity to overcome the inherent problems. In this paper, we introduce a new test concept based on a wireless communication, a specific test access mechanism (TAM), and an optimised architecture. Although this approach is dedicated to an intermediate test of SiP, we explore other potential applications of this technology.

 Conception et Test de Systèmes MICroélectroniques SysMIC
http://www.lirmm.fr/recherche/equipes/sysmic 139590827 0000000405990488 199111950H https://ror.org/013yean28 Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier LIRMM 1995-01-01 2021-12-31
161 rue Ada - 34095 Montpellier
https://www.lirmm.fr Philips France Semiconducteurs 2006
2, rue de la Girafe, BP : 5120, 14079 Caen Cedex 05
0000000120970141 https://ror.org/051escj72 Université de Montpellier UM 2021-12-31
163 rue Auguste Broussonnet - 34090 Montpellier
http://www.umontpellier.fr/ 02636817X 0000000122597504 https://ror.org/02feahw73 Centre National de la Recherche Scientifique CNRS 1939-10-19
https://www.cnrs.fr/