HBM and CDM Stress Evaluation at Circuit Level - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Reports Year : 2006
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lirmm-00102725 , version 1 (02-10-2006)

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  • HAL Id : lirmm-00102725 , version 1

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Marie Lafont, Florence Azaïs, Pascal Nouet. HBM and CDM Stress Evaluation at Circuit Level. 06023, 2006, 15 p. ⟨lirmm-00102725⟩
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