Automatic Test Generation: A Use Case Driven Approach

Abstract : Automatic Test Generation: A Use Case Driven Approach
Document type :
Journal articles
Complete list of metadatas

Cited literature [41 references]  Display  Hide  Download

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102747
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 4:05:14 PM
Last modification on : Friday, November 16, 2018 - 1:25:33 AM
Long-term archiving on : Tuesday, April 6, 2010 - 1:19:30 AM

File

Identifiers

  • HAL Id : lirmm-00102747, version 1

Citation

Clémentine Nebut, F. Fleurey, Y. Le Traon, J.M. Jezequel. Automatic Test Generation: A Use Case Driven Approach. IEEE Transactions on Software Engineering, Institute of Electrical and Electronics Engineers, 2006, 32 (3), pp.140-155. ⟨lirmm-00102747⟩

Share

Metrics

Record views

344

Files downloads

3507