Scan Pattern Watermarking - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006

Scan Pattern Watermarking

David Hely
STMicroelectronics [Rousset]
CV
Frédéric Bancel
  • Function : Author
STMicroelectronics [Rousset]
Marie-Lise Flottes
Conception et Test de Systèmes MICroélectroniques
CV
Bruno Rouzeyre
Conception et Test de Systèmes MICroélectroniques
CV

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102753

Submitted on : Monday, October 2, 2006-4:05:31 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00102753 , version 1 (02-10-2006)

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  • HAL Id : lirmm-00102753 , version 1

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David Hely, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre. Scan Pattern Watermarking. LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, pp.63-67. ⟨lirmm-00102753⟩

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