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An Overview of Failure Mechanisms in Embedded Flash Memories

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102761
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 2, 2006 - 4:10:00 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

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  • HAL Id : lirmm-00102761, version 1

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Olivier Ginez, Jean-Michel Daga, Marylène Combe, Patrick Girard, Christian Landrault, et al.. An Overview of Failure Mechanisms in Embedded Flash Memories. VTS'06: VLSI Test Symposium, Apr 2006, Berkeley, CA, United States. pp.108-113. ⟨lirmm-00102761⟩

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