An Overview of Failure Mechanisms in Embedded Flash Memories - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006

An Overview of Failure Mechanisms in Embedded Flash Memories

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102761

Submitted on : Monday, October 2, 2006-4:10:00 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00102761 , version 1 (02-10-2006)

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  • HAL Id : lirmm-00102761 , version 1

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Olivier Ginez, Jean-Michel Daga, Marylène Combe, Patrick Girard, Christian Landrault, et al.. An Overview of Failure Mechanisms in Embedded Flash Memories. VTS'06: VLSI Test Symposium, Apr 2006, Berkeley, CA, United States. pp.108-113. ⟨lirmm-00102761⟩

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