Conference Papers
Year : 2006
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00102761
Submitted on : Monday, October 2, 2006-4:10:00 PM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00102761 , version 1
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Olivier Ginez, Jean-Michel Daga, Marylène Combe, Patrick Girard, Christian Landrault, et al.. An Overview of Failure Mechanisms in Embedded Flash Memories. VTS'06: VLSI Test Symposium, Apr 2006, Berkeley, CA, United States. pp.108-113. ⟨lirmm-00102761⟩
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