An Overview of Failure Mechanisms in Embedded Flash Memories - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006
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lirmm-00102761 , version 1 (02-10-2006)

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  • HAL Id : lirmm-00102761 , version 1

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Olivier Ginez, Jean-Michel Daga, Marylène Combe, Patrick Girard, Christian Landrault, et al.. An Overview of Failure Mechanisms in Embedded Flash Memories. VTS'06: VLSI Test Symposium, Apr 2006, Berkeley, CA, United States. pp.108-113. ⟨lirmm-00102761⟩
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