I. Bayraktaroglu and A. Orailoglu, Test volume and application time reduction through scan chain concealment, Proceedings of the 38th conference on Design automation , DAC '01, pp.151-155
DOI : 10.1145/378239.378388

K. J. Balakrishman and N. A. Touba, Reconfigurable linear decompressor using symbolic Gaussian elimination, DATE'05, pp.1130-1135

N. Sitchinava, Changing the scan enable during shift, 22nd IEEE VLSI Test Symposium, 2004. Proceedings., pp.73-78
DOI : 10.1109/VTEST.2004.1299228

H. Tang, S. M. Reddy, and I. Pomeranz, On reducing test data volume and test application time for multiple scan chain designs, ITC'03, pp.1079-1088

B. Arslan and A. Orailoglu, Circularscan: a scan architecture for test cost reduction, Proceedings Design, Automation and Test in Europe Conference and Exhibition, pp.1290-1295
DOI : 10.1109/DATE.2004.1269073

A. Jas, B. Pouya, and N. A. Touba, Virtual scan chains: a means for reducing scan length in cores, Proceedings 18th IEEE VLSI Test Symposium, pp.73-78
DOI : 10.1109/VTEST.2000.843829

L. Wang, VirtualScan: a new compressed scan technology for test cost reduction, 2004 International Conferce on Test, p.4
DOI : 10.1109/TEST.2004.1387356

J. Rajski, Embedded deterministic test for low cost manufacturing test, Proceedings. International Test Conference, pp.916-922
DOI : 10.1109/TEST.2002.1041773

L. Li and K. Chakrabarty, Test data compression using dictionaries with selective entries and fixed-length indices, ACM Transactions on Design Automation of Electronic Systems, vol.8, issue.4, pp.470-490, 2003.
DOI : 10.1145/944027.944032

A. Würtenberger, C. S. Tautermann, and S. Hellebrand, Data compression for multiple scan chains using dictionaries with corrections, 2004 International Conferce on Test, pp.926-935
DOI : 10.1109/TEST.2004.1387357

M. Flottes, R. Poirier, and B. Rouzeyre, An arithmetic structure for test data horizontal compression, Proceedings Design, Automation and Test in Europe Conference and Exhibition, pp.428-433
DOI : 10.1109/DATE.2004.1268884

URL : https://hal.archives-ouvertes.fr/lirmm-00108837