Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2005

Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications

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Computer Science [cs]

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00105322

Submitted on : Wednesday, October 11, 2006-7:51:26 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00105322 , version 1 (11-10-2006)

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Florence Azaïs, Serge Bernard, Mariane Comte, Yves Bertrand, Michel Renovell. Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. Journal of Electronic Testing: : Theory and Applications, 2005, 21 (3), pp.291-298. ⟨10.1007/s10836-005-6358-4⟩. ⟨lirmm-00105322⟩

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