Test Control for Secure Scan Designs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2005

Test Control for Secure Scan Designs

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106011

Submitted on : Friday, October 13, 2006-10:22:46 AM

Last modification on : Thursday, April 4, 2024-6:22:45 PM

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lirmm-00106011 , version 1 (13-10-2006)

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  • HAL Id : lirmm-00106011 , version 1

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David Hely, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre. Test Control for Secure Scan Designs. ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.190-195. ⟨lirmm-00106011⟩

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