Modeling Halo Implant Failures in MOS Sub-Micron Technology - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2005
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lirmm-00106513 , version 1 (16-10-2006)

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  • HAL Id : lirmm-00106513 , version 1

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Arnaud Regnier, Jean-Michel Portal, Rachid Bouchakour, Michel Renovell. Modeling Halo Implant Failures in MOS Sub-Micron Technology. LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.29-33. ⟨lirmm-00106513⟩
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