Fast and Fully-Efficient Test Flow for ADCs - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2005

Fast and Fully-Efficient Test Flow for ADCs

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106523

Submitted on : Monday, October 16, 2006-8:38:43 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00106523 , version 1 (16-10-2006)

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  • HAL Id : lirmm-00106523 , version 1

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Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Fast and Fully-Efficient Test Flow for ADCs. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249. ⟨lirmm-00106523⟩

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