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Scan Design and Secure Chips : Can They Work Together

David Hely 1 Frédéric Bancel 2 Marie-Lise Flottes 3 Bruno Rouzeyre 3
1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 ST-CROLLES - STMicroelectronics [Crolles]
3 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : Scan Design and Secure Chips : Can They Work Together
keyword : SECURITE TEST SAMRTCARDS
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106546
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 16, 2006 - 8:45:03 AM
Last modification on : Tuesday, December 18, 2018 - 1:18:13 PM
Long-term archiving on: : Tuesday, April 6, 2010 - 7:47:33 PM

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  • HAL Id : lirmm-00106546, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

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David Hely, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre. Scan Design and Secure Chips : Can They Work Together. SAME'05: Sophia-Antipolis Forum on MicroElectronics, Oct 2005, Sophia-Antipolis, France. ⟨lirmm-00106546⟩

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