Scan Design and Secure Chips : Can They Work Together - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2005

Scan Design and Secure Chips : Can They Work Together

Abstract

Scan Design and Secure Chips : Can They Work Together

Keywords

SAMRTCARDS SECURITE TEST

Domains

Micro and nanotechnologies/Microelectronics
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00106546

Submitted on : Monday, October 16, 2006-8:45:03 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

Long-term archiving on : Tuesday, April 6, 2010-7:47:33 PM

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Dates and versions

lirmm-00106546 , version 1 (16-10-2006)

Identifiers

  • HAL Id : lirmm-00106546 , version 1

Cite

David Hely, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre. Scan Design and Secure Chips : Can They Work Together. SAME'05: Sophia-Antipolis Forum on MicroElectronics, Oct 2005, Sophia-Antipolis, France. ⟨lirmm-00106546⟩

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CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
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