Rachid Bouchakour, Jean-Michel Portal, Jean-Marc J.-M. Galliere, Florence Azaïs, Yves Bertrand, et al.. A Compact DC Model of Gate Oxide Short Defect.
Microelectronic Engineering, Elsevier, 2004, 72 (1-4), pp.140-148.
⟨10.1016/j.mee.2003.12.051⟩.
⟨lirmm-00108564⟩