Power-Driven Routing-Constrained Scan Chain Design - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Journal Articles Journal of Electronic Testing: : Theory and Applications Year : 2004

Power-Driven Routing-Constrained Scan Chain Design

Domains

Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108581

Submitted on : Monday, October 23, 2006-7:43:15 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

Consult on ISTEX platform

Dates and versions

lirmm-00108581 , version 1 (23-10-2006)

Identifiers

Cite

Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. Power-Driven Routing-Constrained Scan Chain Design. Journal of Electronic Testing: : Theory and Applications, 2004, 20 (6), pp.647-660. ⟨10.1007/s10677-004-4252-2⟩. ⟨lirmm-00108581⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
57 View
0 Download

Altmetric

Share

More