Journal Articles
Journal of Electronic Testing: : Theory and Applications
Year : 2004
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108581
Submitted on : Monday, October 23, 2006-7:43:15 AM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. Power-Driven Routing-Constrained Scan Chain Design. Journal of Electronic Testing: : Theory and Applications, 2004, 20 (6), pp.647-660. ⟨10.1007/s10677-004-4252-2⟩. ⟨lirmm-00108581⟩
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