The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults

P. Engelke
  • Function : Author
I. Polian
  • Function : Author
Michel Renovell
Conception et Test de Systèmes MICroélectroniques
CV
B. Seshadri
  • Function : Author
P. Becker
  • Function : Author

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108845

Submitted on : Monday, October 23, 2006-12:56:58 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00108845 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108845 , version 1

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P. Engelke, I. Polian, Michel Renovell, B. Seshadri, P. Becker. The Pros and Cons of Very-Low-Voltage Testing: An Analysis Based on Resistive Bridging Faults. VTS'04: 22nd IEEE VLSI Test Symposium, Apr 2004, Napa Valley, CA (USA), pp.171-178. ⟨lirmm-00108845⟩

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