. Isppac-handbook, Programmable Analog Circuits. Lattice Semiconductor Corporation, 2000.

, Analog and Mixed Signal Test, 1998.

M. Burns and G. W. Roberts, An Introduction to MixedSignal IC Test and Measurement, 2000.

T. Balen, M. Schreiber, F. Azaïs, M. Lubaszewski, and M. Renovell, OBIST Applied to FPAAs: A Case study, pp.238-242, 2003.
URL : https://hal.archives-ouvertes.fr/lirmm-00269501

T. Balen, A. Andrade, F. Azaïs, M. Lubaszewski, and M. Renovell, An Approach to the Built-In Self-Test of Field Programmable Analog Arrays, Proc. 22 nd IEEE VLSI Test Symposium, pp.383-388, 2004.

K. Arabi and B. Kaminska, Testing Analog and MixedSignal Integrated Circuits Using Oscillation-Test Method
DOI : 10.1109/43.644035

, IEEE Trans. CAD on Integrated CAS, issue.7, 1997.

G. Huertas, D. Vázquez, E. J. Peralias, A. Rueda, and J. L. Huertas, Testing Mixed-Signal Cores: A Practical OscillationBased Test in an Analog Macrocell, pp.64-72, 2002.

A. Andrade, G. Vieira, T. Balen, M. Lubaszewski, F. Azaïs et al., Testing Global Interconnects of Field Programmable Analog Arrays, 10 th IEEE International Mixed Signals Testing Workshop, pp.231-236, 2004.
URL : https://hal.archives-ouvertes.fr/lirmm-00108657

M. Lubaszewski, S. Mir, and L. Pulz, ABILBO: Analog BuILt-in Block Observer, IEEE/ACM International Conference on Computer-Aided Design, pp.600-603, 1996.
DOI : 10.1109/iccad.1996.569917
URL : https://hal.archives-ouvertes.fr/hal-00013268

D. Vázquez, G. Leger, G. Huertas, A. Rueda, and J. L. Huertas, A Method for Parametric Extraction of Analog Sinewave Signals for Mixed-signal Built-in Self-test Applications, Design,Automation and Test in Europe Conference and Exhibition, pp.298-303, 2004.