An Efficient Scan Tree Design for Test Time Reduction - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

An Efficient Scan Tree Design for Test Time Reduction

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108901

Submitted on : Monday, October 23, 2006-12:57:11 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00108901 , version 1 (23-10-2006)

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Yannick Bonhomme, Tomohiro Yoneda, Hideo Fujiwara, Patrick Girard. An Efficient Scan Tree Design for Test Time Reduction. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.174-179, ⟨10.1109/ETSYM.2004.1347657⟩. ⟨lirmm-00108901⟩

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