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Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs

Patrick Girard 1 Olivier Héron 2 Serge Pravossoudovitch 1 Michel Renovell 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
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Conference papers
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108905
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Monday, October 23, 2006 - 12:57:12 PM
Last modification on : Friday, August 5, 2022 - 10:48:05 AM

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  • HAL Id : lirmm-00108905, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell. Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.117-122. ⟨lirmm-00108905⟩

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