Skip to Main content Skip to Navigation
Conference papers

Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs

Patrick Girard 1 Olivier Héron 2 Serge Pravossoudovitch 1 Michel Renovell 1
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Document type :
Conference papers
Complete list of metadata
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108905
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 12:57:12 PM
Last modification on : Friday, November 27, 2020 - 6:04:03 PM

Identifiers

  • HAL Id : lirmm-00108905, version 1

Collections

CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

Citation

Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell. Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs. ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.117-122. ⟨lirmm-00108905⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

81