Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs

Patrick Girard; Olivier Héron; Serge Pravossoudovitch; Michel Renovell

Conference papers

Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs

Patrick Girard ¹ Olivier Héron ² Serge Pravossoudovitch ¹ Michel Renovell ¹

1 SysMIC - Conception et Test de Systèmes MICroélectroniques

LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier

2 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108905
Contributor : Christine Carvalho de Matos <>
Submitted on : Monday, October 23, 2006 - 12:57:12 PM
Last modification on : Wednesday, August 28, 2019 - 3:46:02 PM

Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs

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Manufacturing-Oriented Testing of Delay Faults in the Logic Architecture of Symmetrical FPGAs

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