Digital and Analog System Testing: Fundamentals and New Challenges
Résumé
This paper first introduces the fundamentals of digital testing with a special emphasis on the quality-cost tradeoff which guarantees the viability of the process. Different test solutions are then presented with the corresponding advantages and drawbacks. It is demonstrated that the structural test approach is the most viable solution. Finally, the challenges of system-on-chip testing are specifically analyzed highlighting the key parameters.