Skip to Main content Skip to Navigation
Conference papers

Digital and Analog System Testing: Fundamentals and New Challenges

Michel Renovell 1 
1 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Complete list of metadata

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00108936
Contributor : Christine Carvalho De Matos Connect in order to contact the contributor
Submitted on : Monday, October 23, 2006 - 12:57:26 PM
Last modification on : Friday, August 5, 2022 - 10:47:53 AM

Identifiers

  • HAL Id : lirmm-00108936, version 1

Collections

Citation

Michel Renovell. Digital and Analog System Testing: Fundamentals and New Challenges. ICM'04: 16th International Conference on Microelectronics, Dec 2004, Tunis (Tunisia), pp.8-10. ⟨lirmm-00108936⟩

Share

Metrics

Record views

37