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Conference Papers Year : 2004

Digital and Analog System Testing: Fundamentals and New Challenges

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lirmm-00108936 , version 1 (23-10-2006)

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  • HAL Id : lirmm-00108936 , version 1

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Michel Renovell. Digital and Analog System Testing: Fundamentals and New Challenges. ICM'04: 16th International Conference on Microelectronics, Dec 2004, Tunis (Tunisia), pp.8-10. ⟨lirmm-00108936⟩
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