Realistic Fault Models for Defects in Electronic Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

Realistic Fault Models for Defects in Electronic Circuits

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Dates and versions

lirmm-00109134 , version 1 (24-10-2006)

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  • HAL Id : lirmm-00109134 , version 1

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Michel Renovell. Realistic Fault Models for Defects in Electronic Circuits. BEC'04: International Baltic Electronic Conference, Oct 2004, pp.33-37. ⟨lirmm-00109134⟩
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