Conference Papers
Year : 2004
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109142
Submitted on : Tuesday, October 24, 2006-7:31:56 AM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00109142 , version 1
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Pascal Nouet. Electrically-Induced Thermal Stimuli for MEMS Testing. 1st DfMM Summer School, 2004. ⟨lirmm-00109142⟩
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