Electrically-Induced Thermal Stimuli for MEMS Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2004

Electrically-Induced Thermal Stimuli for MEMS Testing

Pascal Nouet
Conception et Test de Systèmes MICroélectroniques
CV

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109142

Submitted on : Tuesday, October 24, 2006-7:31:56 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00109142 , version 1 (24-10-2006)

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  • HAL Id : lirmm-00109142 , version 1

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Pascal Nouet. Electrically-Induced Thermal Stimuli for MEMS Testing. 1st DfMM Summer School, 2004. ⟨lirmm-00109142⟩

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