Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test Standard - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Book Sections Year : 2004

Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test Standard

Florence Azaïs
Conception et Test de Systèmes MICroélectroniques
CV
Pascal Nouet
Conception et Test de Systèmes MICroélectroniques
CV

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00109159

Submitted on : Tuesday, October 24, 2006-7:34:46 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00109159 , version 1 (24-10-2006)

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  • HAL Id : lirmm-00109159 , version 1

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Florence Azaïs, Pascal Nouet. Analog and Mixed-Signal Test Bus: IEEE 1149.4 Test Standard. Huertas J.L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits, Kluwer Academic Publishers, pp.28, 2004, 1-4020-7724-6. ⟨lirmm-00109159⟩

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