Low Power Testing - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006

Low Power Testing

Abstract

Power dissipation has become the major design objective in many application areas, ranging from wireless communicatins to high performance computing, thus leading to the production of numerous so-called low power designs.

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00116819

Submitted on : Tuesday, November 28, 2006-11:15:10 AM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00116819 , version 1 (28-11-2006)

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  • HAL Id : lirmm-00116819 , version 1

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Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. Low Power Testing. WRTLT'06: 7th Workshop on RTL and High Level Testing, Nov 2006, Fukuoka, pp.4. ⟨lirmm-00116819⟩

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