March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2006
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lirmm-00134776 , version 1 (05-03-2007)

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  • HAL Id : lirmm-00134776 , version 1

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Luigi Dilillo, Patrick Girard, Magali Bastian Hage-Hassan, Serge Pravossoudovitch, Arnaud Virazel. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261. ⟨lirmm-00134776⟩
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