Conference Papers
Year : 2006
Christian Landrault : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00134776
Submitted on : Monday, March 5, 2007-1:47:48 PM
Last modification on : Friday, March 24, 2023-2:52:48 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00134776 , version 1
Cite
Luigi Dilillo, Patrick Girard, Magali Bastian Hage-Hassan, Serge Pravossoudovitch, Arnaud Virazel. March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261. ⟨lirmm-00134776⟩
91
View
0
Download