Failure Mechanisms due to Process Variations in Nanoscale SRAM Core-Cells - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Poster Year : 2006

Failure Mechanisms due to Process Variations in Nanoscale SRAM Core-Cells

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00134787

Submitted on : Monday, March 5, 2007-2:05:25 PM

Last modification on : Friday, March 24, 2023-2:52:48 PM

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lirmm-00134787 , version 1 (05-03-2007)

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  • HAL Id : lirmm-00134787 , version 1

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Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Failure Mechanisms due to Process Variations in Nanoscale SRAM Core-Cells. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. 11th IEEE European Test Symposium, 2006. ⟨lirmm-00134787⟩

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