Conference Poster
Year : 2006
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00134787
Submitted on : Monday, March 5, 2007-2:05:25 PM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : lirmm-00134787 , version 1
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Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan. Failure Mechanisms due to Process Variations in Nanoscale SRAM Core-Cells. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. 11th IEEE European Test Symposium, 2006. ⟨lirmm-00134787⟩
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