]. M. Abramavoci, P. R. Abramovici, D. T. Menon, and . Miller, Critical Path Tracing: An Alternative to Fault Simulation, IEEE Design & Test of Computers, vol.1, issue.1, pp.1-83, 1984.
DOI : 10.1109/MDT.1984.5005582

]. S. Mitra and K. S. Kim, X-compact: an efficient response compaction technique for test cost reduction, Proceedings. International Test Conference, pp.311-320, 2002.
DOI : 10.1109/TEST.2002.1041774

]. G. Mrugalski, A. Pogiel, J. Rajski, J. Tyszer, and C. Wang, Fault diagnosis in designs with convolutional compactors, 2004 International Conferce on Test, pp.498-507, 2004.
DOI : 10.1109/TEST.2004.1386986

]. P. Girard, C. Landrault, and S. Pravossoudovitch, An advanced diagnostic method for delay faults in combinational faulty circuits, Journal of Electronic Testing, vol.5, issue.No 2, pp.3-277, 1995.
DOI : 10.1007/BF00996437

C. Yuan, S. Hsu, and . Gupta, A New Path-Oriented Effect-Cause Methodology to Diagnose Delay Failure, International Test Conference, pp.758-767, 1998.

K. Fuchs and «. A. , Deductive Technique for Diagnosis of Bridging Fault, Internationel Conference on Computer Aided Design, pp.562-567, 1997.

W. Xinyue-fan, C. Moore, G. Hora, and . Gronthoud, A novel stuck-at based method for transistor stuck-open fault diagnosis, IEEE International Conference on Test, 2005., pp.1-4, 2005.
DOI : 10.1109/TEST.2005.1583996

. P. Girard, C. Girard, S. Landrault, and . Pravossoudovitch, A novel approach to delay-fault diagnosis, [1992] Proceedings 29th ACM/IEEE Design Automation Conference, pp.357-360, 1992.
DOI : 10.1109/DAC.1992.227778

. P. Girarg, C. Girard, S. Landrault, and . Pravossoudovitch, Delay Fault Diagnosis Based on Critical Path Tracing from Symbolic Simulation, ISCAS92, IEEE International Symposium on Circuits and Systems, pp.1133-1136, 1992.

B. David, B. Lavo, T. Chess, F. Larrabee, and . Fergusson, Diagnosing Realistic Bridging Faults with Single Stuck-At Information, IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, vol.17, pp.3-255, 1998.

I. Piet-engelke, M. Polian, B. Renovell, and . Becker, Simulating Resistive Bridging and Stuck-At Faults, International Test Conference, pp.1051-1059, 2003.