Proceedings of the 3rd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2006) - Jan 17-19, 2006 - Kuala Lumpur, Malaysia
Résumé
The following topics are dealt with: fault diagnosis; analog components; integrated circuit design; image and video processing; integrated circuit testing; electronics education; logic design and optimization; electromagnetic sensors and devices; fault modeling; microprocessors; microphotonics; built in self test; fault tolerance; signal processing; design verification and concurrent checking