Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window
Abstract
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Martine Peridier : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00151034
Submitted on : Friday, June 1, 2007-2:53:19 PM
Last modification on : Friday, March 24, 2023-2:52:48 PM