TAM Design and Test Data Compression for SoC Test Cost Reduction - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Poster Year : 2007

TAM Design and Test Data Compression for SoC Test Cost Reduction

Abstract

TAM Design and Test Data Compression for SoC Test Cost Reduction

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Micro and nanotechnologies/Microelectronics
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00159044

Submitted on : Monday, November 12, 2007-4:50:50 PM

Last modification on : Friday, March 24, 2023-2:52:49 PM

Long-term archiving on : Thursday, April 8, 2010-10:14:10 PM

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Dates and versions

lirmm-00159044 , version 1 (12-11-2007)

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  • HAL Id : lirmm-00159044 , version 1

Cite

Julien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre. TAM Design and Test Data Compression for SoC Test Cost Reduction. ETS: European Test Symposium, May 2007, Freiburg, Germany. 12th IEEE European Test Symposium, pp.241-246, 2007. ⟨lirmm-00159044⟩

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