A Fault-Tolerant MEF Peptide Synthesizer using Control and Direct Sensing Electrodes Employing Current and Impedance Tests

X. Zhang; H.G. Kerkhoff; Frédérick Mailly; Pascal Nouet; Hong Liu; A. D. Richardson

Conference Papers Year : 2007

A Fault-Tolerant MEF Peptide Synthesizer using Control and Direct Sensing Electrodes Employing Current and Impedance Tests

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X. Zhang

Function : Author

CTIT - Testable Design & Test of Integrated Systems

H.G. Kerkhoff

Function : Author

CTIT - Testable Design & Test of Integrated Systems

Frédérick Mailly

Function : Author
PersonId : 6351
IdHAL : frederick-mailly
ORCID : 0000-0002-4030-0505
IdRef : 069998965

Conception et Test de Systèmes MICroélectroniques

CV

Pascal Nouet

Function : Author
PersonId : 6242
IdHAL : pascal-nouet
ORCID : 0000-0003-2137-2623
IdRef : 079135196

Conception et Test de Systèmes MICroélectroniques

CV

Hong Liu

Function : Author

Centre for Microsystems Engineering

A. D. Richardson

Function : Author

Centre for Microsystems Engineering

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00161699

Submitted on : Wednesday, July 11, 2007-2:17:57 PM

Last modification on : Friday, March 24, 2023-2:52:49 PM

Dates and versions

lirmm-00161699 , version 1 (11-07-2007)

Identifiers

HAL Id : lirmm-00161699 , version 1

Cite

X. Zhang, H.G. Kerkhoff, Frédérick Mailly, Pascal Nouet, Hong Liu, et al.. A Fault-Tolerant MEF Peptide Synthesizer using Control and Direct Sensing Electrodes Employing Current and Impedance Tests. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, pp.176-181. ⟨lirmm-00161699⟩

A Fault-Tolerant MEF Peptide Synthesizer using Control and Direct Sensing Electrodes Employing Current and Impedance Tests

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