Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2007

Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00161708

Submitted on : Wednesday, July 11, 2007-2:29:01 PM

Last modification on : Friday, March 24, 2023-2:52:49 PM

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lirmm-00161708 , version 1 (11-07-2007)

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  • HAL Id : lirmm-00161708 , version 1

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Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201. ⟨lirmm-00161708⟩

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