Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2007

Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits

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Micro and nanotechnologies/Microelectronics

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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00179262

Submitted on : Monday, October 15, 2007-10:43:00 AM

Last modification on : Friday, March 24, 2023-2:52:49 PM

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lirmm-00179262 , version 1 (15-10-2007)

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  • HAL Id : lirmm-00179262 , version 1

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Florence Azaïs, Laurent Larguier, Michel Renovell. Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits. ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244. ⟨lirmm-00179262⟩

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