Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits

Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00179262
Contributor : Martine Peridier <>
Submitted on : Monday, October 15, 2007 - 10:43:00 AM
Last modification on : Friday, July 20, 2018 - 12:34:01 PM

Identifiers

  • HAL Id : lirmm-00179262, version 1

Collections

Citation

Florence Azaïs, Laurent Larguier, Michel Renovell. Impact of Simultaneous Switching Noise on the Static Behavior of Digital CMOS Circuits. ATS: Asian Test Symposium, Oct 2007, Beijing, China. pp.239-244. ⟨lirmm-00179262⟩

Share

Metrics

Record views

91