A. J. Van-de-goor, S. Hamdioui, and R. Wadsworth, Detecting faults in the peripheral circuits and an evaluation of SRAM tests, 2004 International Conferce on Test, pp.114-123, 2004.
DOI : 10.1109/TEST.2004.1386943

A. J. Van-de-goor and Z. , Functional memory faults: a formal notation and a taxonomy, Proceedings 18th IEEE VLSI Test Symposium, pp.281-289, 2000.
DOI : 10.1109/VTEST.2000.843856

Z. Al-ars and A. J. Van-de-goor, Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001, pp.496-503, 2001.
DOI : 10.1109/DATE.2001.915069

S. Hamdioui, R. Wadsworth, J. D. Reyes, and A. J. Van-de-goor, Importance of dynamic faults for new SRAM technologies, The Eighth IEEE European Test Workshop, 2003. Proceedings., pp.29-34, 2003.
DOI : 10.1109/ETW.2003.1231665

D. Niggemeyer, M. Redeker, and J. Otterstedt, Integration of non-classical faults in standard March tests, Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236), pp.91-96, 1998.
DOI : 10.1109/MTDT.1998.705953