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, He is currently professor in the electrical and computer engineering department of the University of Montpellier and his research activities are performed at LIRMM (Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier) He got the PhD degree in electrical engineering in 1983 for his work on symbolic layout for IC design. Since 1984, he is working in the testing domain. He obtained the "doctorat d'état" degree in 1987 for his work on switch level automatic test pattern generation. He is presently interested in memory testing, delay fault testing, design for testability and power consumption optimization, 1957.
, He is currently Assistant Professor at the University of Montpellier II, and works in the Microelectronics Department of the LIRMM (Laboratory of Informatics, Robotics and Microelectronics of Montpellier -France) Arnaud Virazel is on the technical program Arnaud Virazel has been involved in several European research projects (MEDEA+ ASSOCIATE, MEDEA+ NanoTEST) His research interests include the various aspects of digital testing, with special emphasis on DfT, BIST, diagnosis, delay testing, power-aware testing and memory testing, the International Conference on Embedded And Ubiquitous Computing (EUC) in 2005 He has published 10 journal papers, and more than 20 conference and symposium papers on these fields, 1974.
, She received a Master of Science degree of Microelectronics and Automatics from the Institute of Engineering Sciences of Montpellier in 2003. She is currently working for Infineon in the memory library department in Sophia-Antipolis. She participated to the European research project MEDEA associate. Bastian's interest include memory test, 1979.