Power Supply Investigation for Wireless Wafer Test - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2008

Power Supply Investigation for Wireless Wafer Test

Domains

Micro and nanotechnologies/Microelectronics

Martine Peridier  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00260205

Submitted on : Monday, March 3, 2008-3:10:24 PM

Last modification on : Friday, March 24, 2023-2:52:49 PM

No file

Dates and versions

lirmm-00260205 , version 1 (03-03-2008)

Identifiers

  • HAL Id : lirmm-00260205 , version 1

Cite

Ziad Noun, Philippe Cauvet, Marie-Lise Flottes, Serge Bernard, David Andreu, et al.. Power Supply Investigation for Wireless Wafer Test. LATW'08: 9th Latin-American Test Workshop, Mar 2008, Puebla, Mexico. pp.165-170. ⟨lirmm-00260205⟩

Export

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

CNRS SYSMIC LIRMM LIRMM_MIC MIC MIPS UNIV-MONTPELLIER
100 View
0 Download

Share

More