Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2002

Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit

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Micro and nanotechnologies/Microelectronics

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268434

Submitted on : Tuesday, April 1, 2008-9:27:18 AM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00268434 , version 1 (01-04-2008)

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  • HAL Id : lirmm-00268434 , version 1

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Wenceslas Rahajandraibe, Daniel Auvergne, Christian Dufaza, Bruno Cialdella, Bernard Majoux, et al.. Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit. DCIS 2002 - 17th Conference on Design of Circuits and Integrated Systems, 2002, Santander, Spain. pp.637-642. ⟨lirmm-00268434⟩

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