Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit

Document type :
Conference papers
Complete list of metadatas

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268434
Contributor : Christine Carvalho de Matos <>
Submitted on : Tuesday, April 1, 2008 - 9:27:18 AM
Last modification on : Thursday, May 24, 2018 - 3:59:20 PM

Identifiers

  • HAL Id : lirmm-00268434, version 1

Collections

Citation

Wenceslas Rahajandraibe, Daniel Auvergne, Christian Dufaza, Bruno Cialdella, Bernard Majoux, et al.. Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit. DCIS'02: 17th International Conference on Design of Circuits and Integrated Systems, Santander (Spain), pp.637-642. ⟨lirmm-00268434⟩

Share

Metrics

Record views

55