Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit

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Communication dans un congrès
DCIS'02: 17th International Conference on Design of Circuits and Integrated Systems, Santander (Spain), pp.637-642, 2002
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268434
Contributeur : Christine Carvalho de Matos <>
Soumis le : mardi 1 avril 2008 - 09:27:18
Dernière modification le : jeudi 24 mai 2018 - 15:59:20

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  • HAL Id : lirmm-00268434, version 1

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Wenceslas Rahajandraibe, Daniel Auvergne, Christian Dufaza, Bruno Cialdella, Bernard Majoux, et al.. Process Characterization for a Very Low Power High Temperature Stability Bandgap Reference Circuit. DCIS'02: 17th International Conference on Design of Circuits and Integrated Systems, Santander (Spain), pp.637-642, 2002. 〈lirmm-00268434〉

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