Conference Papers
Year : 2002
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268484
Submitted on : Tuesday, April 1, 2008-9:27:29 AM
Last modification on : Friday, March 24, 2023-2:52:50 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00268484 , version 1
Cite
Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems. VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444. ⟨lirmm-00268484⟩
70
View
0
Download