Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2002

Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems

Christine Carvalho De Matos  : Connect in order to contact the contributor

https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268484

Submitted on : Tuesday, April 1, 2008-9:27:29 AM

Last modification on : Friday, March 24, 2023-2:52:50 PM

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lirmm-00268484 , version 1 (01-04-2008)

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  • HAL Id : lirmm-00268484 , version 1

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Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Evaluation of the Oscillation-Based Test Methodology for Micro-Electro-Mechanical Systems. VTS'02: 20th IEEE VLSI Test Symposium, Monterey, CA, USA, pp.439-444. ⟨lirmm-00268484⟩

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