Conference Papers
Year : 2002
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268493
Submitted on : Tuesday, April 1, 2008-9:27:32 AM
Last modification on : Wednesday, January 8, 2025-11:18:09 AM
Dates and versions
Identifiers
- HAL Id : lirmm-00268493 , version 1
Cite
Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch. Test Power: A Big Issue in Large SOC Design. IEEE International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.447-449. ⟨lirmm-00268493⟩
53
View
0
Download