Conference Papers
Year : 2002
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00268499
Submitted on : Tuesday, April 1, 2008-9:27:33 AM
Last modification on : Thursday, April 4, 2024-9:28:28 PM
Dates and versions
Identifiers
- HAL Id : lirmm-00268499 , version 1
Cite
René M. G. David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. On Using Efficient Test Sequences for BIST. VTS: VLSI Test Symposium, 2002, Monterey, CA, United States. pp.145-150. ⟨lirmm-00268499⟩
72
View
0
Download