On Using Efficient Test Sequences for BIST - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2002
No file

Dates and versions

lirmm-00268499 , version 1 (01-04-2008)

Identifiers

  • HAL Id : lirmm-00268499 , version 1

Cite

René M. G. David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. On Using Efficient Test Sequences for BIST. VTS: VLSI Test Symposium, 2002, Monterey, CA, United States. pp.145-150. ⟨lirmm-00268499⟩
72 View
0 Download

Share

More