Wenceslas Rahajandraibe, Christian Dufaza, Daniel Auvergne, Bruno Cialdella, Bernard Majoux, et al.. Test Structure for Ic(Vbe) Parameter Determination of Low Voltage Applications.
DATE: Design, Automation and Test in Europe, Mar 2002, Paris, France. pp.316-321,
⟨10.1109/DATE.2002.998291⟩.
⟨lirmm-00268524⟩