Experimental test infrastructure supporting IEEE 11494 Standard - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier
Conference Papers Year : 2002

Experimental test infrastructure supporting IEEE 11494 Standard

Abstract

The IEEE 1149 4 standard for a mixed-signal test bus (Dot4) [1], which addresses the application of boundary- scan test techniques in mixed analog / digital circuits, was adopted already in 1999 However, major electronic manufacturers, with few exceptions [2], do not seem very keen to include Dot4 support into their products It is our belief that wider acceptance of Dot 4 mixed-signal test bus will only come with the demonstration of its benefits in actual designs and the presentation of innovative and efficient applications of the Dot 4 infrastructure [3, 4] To support development and evaluation of Dot4 based test and measurement procedures we decided to design and implement a series of experimental Dot 4 chips to serve as technology demonstrator vehicles
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Dates and versions

lirmm-00268606 , version 1 (21-01-2017)

Identifiers

  • HAL Id : lirmm-00268606 , version 1

Cite

Uroš Kač, Franc Novak, Jozef Stefan, Florence Azaïs, Pascal Nouet, et al.. Experimental test infrastructure supporting IEEE 11494 Standard. ETW: European Test Workshop, 2002, Corfou, Greece. ⟨lirmm-00268606⟩
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