Conference Papers
Year : 2002
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269323
Submitted on : Wednesday, April 2, 2008-4:46:00 PM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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- HAL Id : lirmm-00269323 , version 1
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Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology. LATW 2002 - 3rd IEEE Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.99-104. ⟨lirmm-00269323⟩
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