Conference Papers
Year : 2002
Christine Carvalho De Matos : Connect in order to contact the contributor
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269340
Submitted on : Wednesday, April 2, 2008-4:46:05 PM
Last modification on : Friday, March 24, 2023-2:52:50 PM
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- HAL Id : lirmm-00269340 , version 1
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Florence Azaïs, Pascal Nouet, Uroš Kač, Franc Novak. Design of an IEEE 1149.4 Test Chip with Extended ABM Functionality. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Montreux (Suisse), France. pp. 153-159. ⟨lirmm-00269340⟩
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