Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults - LIRMM - Laboratoire d’Informatique, de Robotique et de Microélectronique de Montpellier Access content directly
Conference Papers Year : 2003

Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults

Abstract

In this paper we introduce the use of Monte-Carlo (MC) simulations in order to facilitate OTM implementation and to evaluate fault coverage quantitatively even for parametric faults. Thanks to a case study, we demonstrate the contribution of MC simulations for both tolerance range and test efficiency determination.
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Dates and versions

lirmm-00269433 , version 1 (03-04-2008)

Identifiers

  • HAL Id : lirmm-00269433 , version 1

Cite

Aboubacar Chaehoi, Yves Bertrand, Laurent Latorre, Pascal Nouet. Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.234-237. ⟨lirmm-00269433⟩
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