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Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults

Aboubacar Chaehoi 1 Yves Bertrand 2 Laurent Latorre 2 Pascal Nouet 2
1 LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
2 SysMIC - Conception et Test de Systèmes MICroélectroniques
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : In this paper we introduce the use of Monte-Carlo (MC) simulations in order to facilitate OTM implementation and to evaluate fault coverage quantitatively even for parametric faults. Thanks to a case study, we demonstrate the contribution of MC simulations for both tolerance range and test efficiency determination.
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https://hal-lirmm.ccsd.cnrs.fr/lirmm-00269433
Contributor : Christine Carvalho de Matos <>
Submitted on : Thursday, April 3, 2008 - 8:11:54 AM
Last modification on : Thursday, May 24, 2018 - 3:59:24 PM
Long-term archiving on: : Friday, May 21, 2010 - 1:12:17 AM

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  • HAL Id : lirmm-00269433, version 1

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CNRS | SYSMIC | LIRMM | LIRMM_MIC | MIC | MIPS | UNIV-MONTPELLIER

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Aboubacar Chaehoi, Yves Bertrand, Laurent Latorre, Pascal Nouet. Improving the Efficiency of the Oscillation-Based Test Methodology for Parametric Faults. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.234-237. ⟨lirmm-00269433⟩

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